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Title: Application of the Recent ARF1 Calibration Measurements to the Pbar RF Curve Loading Console Application (P2)

Technical Report ·
DOI:https://doi.org/10.2172/984574· OSTI ID:984574

The P2 console application (Antiproton Source RF Files) calculates frequency and voltage curves from a sequence of command statements input by the user. P2 initially calculates these curves in terms of the actual frequencies and voltages required on the RF cavity as a function of time. These curves are then converted to the appropriate low-level drive voltages that will cause the RF system high-level electronics to generate the required frequency and voltage ramps. The low-level drive ramps are then downloaded into CAMAC ramp cards. In order to convert the required cavity voltage and frequency into the correct drive voltages P2 uses a set of constants that determined from calibration measurements of the various Antiproton Source RF systems. These constants are editable from the P2 constants window. The P2 constants at the time of this writing are shown in Figure 1. The validity of these constants determines the extent to which P2 able to translate the user's commands into the actual voltages and frequencies that appear on the RF cavity. A comparison of the 4/18/2001 calibration of ARF1 with that presently assumed by P2 shows a large discrepancy in both the frequency constants and the voltage constants. This report documents the determination of the P2 ARF1 constants from the calibration measurements that were made on April 18, 2001. In addition, this report will compare the measured response of ARF1 to that derived from the present P2 constants. This comparison will be used to explain some resent observations of ARF1 behavior.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
984574
Report Number(s):
FERMILAB-PBAR-NOTE-660; oai:inspirehep.net:863811; TRN: US1005989
Country of Publication:
United States
Language:
English

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