Structural, Magnetic, and Microwave Properties of BaFe10.5Mn1.5O19 Thin Films

Journal Article · Tue Jan 01 00:00:00 EST 2008 · IEEE Transactions on Magnetics

DOI:https://doi.org/10.1109/TMAG.2008.2001342· OSTI ID:980536

Geiler, A; Yang, A; Zuo, X; Yoon, S; Chen, Y; Harris, V; Vittoria, C

Epitaxial manganese substituted M-type barium ferrite thin films are deposited by alternating target laser ablation deposition (ATLAD) of BaFe{sub 2}O{sub 4}, Fe{sub 2}O{sub 3}, and MnFe{sub 2}O{sub 4} targets. The crystal structure and the epitaxy of the films are investigated by X-ray diffraction. Surface morphology is studied by atomic force microscopy. Magnetic properties of the films are characterized by vibrating sample magnetometry and magnetization as a function of temperature measurements. Ferromagnetic resonance (FMR) measurements are utilized to study the dynamic properties of the films. Possible mechanisms for main FMR linewidth broadening as a result of Mn substitution, such as increased conductivity and the presence of Jahn-Teller effect associated with octahedrally coordinated Mn{sup 3+} cations, are briefly discussed. Extended absorption X-ray fine structure measurements are performed to determine the cation distribution in the hexagonal unit cell. The observed 15-20% increase in saturation magnetization at 4 K and 50 K increase in the Neel temperature in comparison to bulk reference values are attributed to differences in cation distribution as a result of atomic scale deposition by the ATLAD technique.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 980536
• Report Number(s): BNL-93454-2010-JA; TRN: US201015%%1921
• Journal Information: IEEE Transactions on Magnetics, Vol. 44, Issue 11
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABLATION
ATOMIC FORCE MICROSCOPY
BARIUM OXIDES
CRYSTAL STRUCTURE
DEPOSITION
FERROMAGNETIC RESONANCE
FILMS
FINE STRUCTURE
IRON OXIDES
JAHN-TELLER EFFECT
MANGANESE
MANGANESE OXIDES
MAGNETIC PROPERTIES
NEEL TEMPERATURE
TEMPERATURE MEASUREMENT
THIN FILMS
X-RAY DIFFRACTION
national synchrotron light source