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Title: A Variation of the F-Test for Determining Statistical Relevance of Particular Parameters in EXAFS Fits

Conference · · AIP Conf.Proc.882:129,2007
OSTI ID:953921

A general problem when fitting EXAFS data is determining whether particular parameters are statistically significant. The F-test is an excellent way of determining relevance in EXAFS because it only relies on the ratio of the fit residual of two possible models, and therefore the data errors approximately cancel. Although this test is widely used in crystallography (there, it is often called a 'Hamilton test') and has been properly applied to EXAFS data in the past, it is very rarely applied in EXAFS analysis. We have implemented a variation of the F-test adapted for EXAFS data analysis in the RSXAP analysis package, and demonstrate its applicability with a few examples, including determining whether a particular scattering shell is warranted, and differentiating between two possible species or two possible structures in a given shell.

Research Organization:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-76SF00515
OSTI ID:
953921
Report Number(s):
SLAC-REPRINT-2009-471; TRN: US201004%%658
Journal Information:
AIP Conf.Proc.882:129,2007, Conference: 13th International Conference on X-ray Absorption Fine Structure - XAFS13, Melville, New York
Country of Publication:
United States
Language:
English