Electronic Structure in Thin Film Organic Semiconductors Studied using Soft X-ray Emission and Resonant Inelastic X-ray Scattering
The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near E{sub F}. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 930101
- Report Number(s):
- BNL-80739-2008-JA; THSFAP; TRN: US0806705
- Journal Information:
- Thin Solid Films, Vol. 515; ISSN 0040-6090
- Country of Publication:
- United States
- Language:
- English
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