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Title: Microstructure of Diamond-SiC Nanocomposites Determined by X-ray Line Profile Analysis

Journal Article · · Diamond Relat. Mater.

Diamond composites with nanosize diamond crystals and nanosize SiC matrix were obtained at 8 GPa and temperatures varied between 1800 and 2000 degrees C. Multiple Whole Profile fitting method applied to X-ray diffractograms of sintered composites provided information on crystallite size and population of dislocations. When the temperature was increased at a constant pressure, it led to a growth of crystallite sizes in both phases and reduced population of dislocations. Porosity was limiting hardness of the specimens indicating importance of sample preparation prior to sintering nanosize diamond powders.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
Sponsoring Organization:
Doe - Office Of Science
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
913999
Report Number(s):
BNL-78567-2007-JA; TRN: US0801463
Journal Information:
Diamond Relat. Mater., Vol. 15, Issue 9
Country of Publication:
United States
Language:
English

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