Ion source for high-precision mass spectrometry

Patent · Tue Jul 10 00:00:00 EDT 1984

OSTI ID:7256016

Todd, P J; McKown, H S; Smith, D H

The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit. 3 figs.

• Assignee: Dept. of Energy, Washington, DC (United States)
• Patent Number(s): US 4459481; A
• Application Number: PPN: US 6-371744
• OSTI ID: 7256016
• Resource Relation: Patent File Date: 26 Apr 1982
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ION SOURCES
DESIGN
MASS SPECTROMETERS
CATIONS
COLLIMATORS
ION BEAMS
BEAMS
CHARGED PARTICLES
IONS
MEASURING INSTRUMENTS
SPECTROMETERS
400102* - Chemical & Spectral Procedures