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Title: A preliminary investigation of the Cr{sub 3}Si-Mo pseudo-binary phase diagram

Book ·
OSTI ID:72500
;  [1];  [2]
  1. Case Western Reserve Univ., Cleveland, OH (United States)
  2. NASA Lewis Research Center, Cleveland, OH (United States)

An investigation was undertaken to study the phase relations in Cr{sub 3}Si alloyed with Mo varying from 10 to 3.5 wt. % of the material. Specimens were prepared from arc-melted buttons that were subsequently heat treated at 1,673 K for 200 h and air quenched to room temperature to preserve the high temperature microstructures. Alloys containing more than 20 wt. % Mo were primarily two-phase materials of M{sub 3}Si and M{sub 5}Si{sub 3}, where M is (Cr,Mo). Three alloys contained less than 5 % of a third phase, which also had the M{sub 5}Si{sub 3} crystal structure. Differential thermal analysis (DTA) was performed on several specimens at temperatures up to 2,073 K in order to determine a solidus curve for the M{sub 3}Si phase. Since only one DTA peak was observed in each alloy, the M{sub 5}Si{sub 3} phase must melt above 2,073 K, the maximum temperature examined. A preliminary pseudo-binary phase diagram for (Cr,Mo){sub 3}Si and a portion of the 1,673 K isothermal section of the Cr-Mo-Si ternary phase diagram are presented.

OSTI ID:
72500
Report Number(s):
CONF-941144-; ISBN 1-55899-265-0; TRN: IM9530%%112
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994; Other Information: PBD: 1995; Related Information: Is Part Of High-temperature ordered intermetallic alloys VI: Part 2. Materials Research Society symposium proceedings Volume 364; Horton, J. [ed.] [Oak Ridge National Lab., Oak Ridge, TN (United States)]; Baker, I. [ed.] [Dartmouth College, Hanover, NH (United States)]; Hanada, Shuji [ed.] [Tohoku Univ., Sendai (Japan)]; Noebe, R.D. [ed.] [NASA Lewis Research Center, Cleveland, OH (United States)]; Schwartz, D.S. [ed.] [McDonnell Douglas Aerospace, St. Louis, MO (United States)]; PB: 760 p.
Country of Publication:
United States
Language:
English