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Title: New, high performance nuclear spectroscopy system using Si-PIN diodes and CdTe detectors

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:7155364
; ;  [1]; ; ;  [2]
  1. AMPTEK, Inc., Bedford, MA (United States)
  2. Radiation Monitoring Devices, Inc., Watertown, MA (United States)

A compact, high resolution X-ray and gamma ray spectroscopy system has recently been developed which provides excellent energy resolution over a wide range of photon energies. Two detector types have been tested, a cooled silicon PIN photodiode for X-ray energies from 2 keV to 30 keV and a CdTe detector for energies from 20 keV to 1 MeV. The CdTe detector can be operated cooled or at room temperature. The heart of the system is a miniature preamplifier developed at AMPTEK which is used in combination with a small thermoelectric cooler to reduce the leakage current of the detectors. Using the cooled Si-PIN detector, 660 eV FWHM was achieved at 5.9 keV and using a CdTe detector 1.3 keV was achieved at 60 keV both with nearly 100% counting efficiency. Good resolution was also achieved at higher energies.

OSTI ID:
7155364
Report Number(s):
CONF-931051-; CODEN: IETNAE; TRN: 94-022999
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 41:4Pt1; Conference: NSS-MIC '93: nuclear science symposium and medical imaging conference, San Francisco, CA (United States), 30 Oct - 6 Nov 1993; ISSN 0018-9499
Country of Publication:
United States
Language:
English