Ar L -shell Auger-electron emission in ion-solid collisions

Journal Article · Sun Nov 01 00:00:00 EST 1992 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.46.11405· OSTI ID:7028661

Xu, F; Bonanno, A ^[1]

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1. Dipartimento di Fisica, Universita della Calabria, 87036 Arcavacata di Rende, Cosenza (Italy)

Ar {ital L}-shell Auger-electron emission has been studied by bombarding Si, Ti, and condensed Ar surfaces with 5--15-keV Ar{sup +} ions. Our spectra show clear evidence for ion-solid interactions. The eventual 3{ital p} vacancies of most of the outgoing inner excited Ar particles are filled by the solid valence electrons but some of them can still survive such a charge-transfer process. The Auger electrons emitted in the vacuum will give rise to well-separated {ital L}{sub 23}{ital MM} and {ital L}{sub 23}{ital M23}-{ital M}{sup 3} peaks in the observed spectra. The neutralization probability strongly depends on the nature and condition of the target surface and a large variation of the relative intensities has been observed by changing the effective thickness of the Ar layer condensed on an Al substrate. Spectra obtained for Ar{sup +}-Si, Ar{sup +}-Ar, and Ar{sup +}-Ti systems show very different and strongly primary energy-dependent intensity ratio between various {ital L}{sub 23} peaks suggesting a great influence of the solid environment on the relative transition rates. Further, our results show that the {ital L}{sub 23}{ital M1}{ital M23} to {ital L}{sub 23}{ital M23}{ital M23} intensity ratio for an inner excited Ar atom moving in a solid can be substantially different from that for a stationary atom embedded in the bulk matrix. Some weak Auger features in the high-energy spectral regions have also been observed and identified. A vacancy-transfer mechanism involving a two-electron process has been proposed for the Ar 2{ital p} electron promotion in Ar-Si collisions.

• OSTI ID: 7028661
• Journal Information: Physical Review, B: Condensed Matter; (United States), Vol. 46:18; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ARGON
ION COLLISIONS
ARGON IONS
COLLISIONS
SILICON
TITANIUM
AUGER EFFECT
AUGER ELECTRON SPECTROSCOPY
CHARGE EXCHANGE
ION BEAMS
KEV RANGE 01-10
KEV RANGE 10-100
L SHELL
SOLIDS
VACANCIES
BEAMS
CHARGED PARTICLES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
ELECTRON SPECTROSCOPY
ELECTRONIC STRUCTURE
ELEMENTS
ENERGY RANGE
FLUIDS
GASES
IONS
KEV RANGE
METALS
NONMETALS
POINT DEFECTS
RARE GASES
SEMIMETALS
SPECTROSCOPY
TRANSITION ELEMENTS
665300* - Interactions Between Beams & Condensed Matter- (1992-)