Surface analytical study of CuInSe{sub 2} treated in Cd-containing partial electrolyte solution
Junction formation in CuInSe{sub 2} (CIS) has been studied by exposing thin films and single-crystal samples to solutions containing NH{sub 4}OH and CdSO{sub 4}. The treated samples were analyzed by secondary ion mass spectrometry to determine the amount and distribution of Cd deposited on the surface of the films. Cadmium is found to react with the surface for all the solution exposure times and temperatures studied. The reaction rapidly approaches the endpoint and remains relatively unchanged for subsequent solution exposure. Cadmium in-diffusion, as measured by secondary ion mass spectrometry, is obscured by topography effects in the thin-film samples and by ion-beam mixing and topography in the single-crystal sample. {copyright} {ital 1999 American Institute of Physics.}
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC36-83CH10093
- OSTI ID:
- 700933
- Report Number(s):
- CONF-980935-; ISSN 0094-243X; TRN: 9915M0021
- Journal Information:
- AIP Conference Proceedings, Vol. 462, Issue 1; Conference: 15. National Center for Photovoltaics program review conference, Denver, CO (United States), 9-11 Sep 1998; Other Information: PBD: Mar 1999
- Country of Publication:
- United States
- Language:
- English
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