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Title: Longitudinal electroptic effects and photosensitivities of lead zirconate titanate thin films

Journal Article · · Journal of the American Ceramic Society; (USA)
 [1]
  1. Sandia National Labs., Albuquerque NM (US)

The feasibility of storing and reading high-density optical information in lead zirconate titanate (PZT) and in lead lanthanum zirconate titanate (PLZT) thin films depends on both the longitudinal electrooptic coefficients and the photosensitivities of the films. This paper describes the methods used to measure the longitudinal electrooptic effects and the photosensitivities of the films. The results of these measurements were used to evaluate a longitudinal quadratic electrooptic R coefficient, a longitudinal linear electrooptic r{sub c} coefficient, and the wavelength dependence of the photosensitivity of a composition of PZT polycrystalline thin film. The longitudinal electrooptic R and r{sub c} coefficients are about an order of magnitude less than the transverse R and r{sub c} coefficients of bulk ceramics of similar compositions. This is attributed to clamping of the film by the rigid substrate. The large birefringence of the films after poling (>10{sup {minus} 2}) suggests that the optic axes of the films are preferentially oriented normal to the film surface. The techniques used in this paper for evaluating the photosensitivities of thin films are based on measuring the photocurrent generated rather than the reduction in coercive voltage (as in bulk ceramics) when the film is exposed to light.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
7007735
Journal Information:
Journal of the American Ceramic Society; (USA), Vol. 72:11; ISSN 0002-7820
Country of Publication:
United States
Language:
English