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Title: Magnetic characterization of epitaxial Y[sub 5]Fe[sub e]O[sub 12]/Bi[sub 3]Fe[sub 5]O[sub 12] and Y[sub 5]Fe[sub 3]O[sub 12]/Eu[sub 1]Bi[sub 2]Fe[sub 5] O[sub 12] heterostructures grown by pulsed laser deposition

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.358307· OSTI ID:6955242
 [1]; ;  [2];  [1];  [3];  [4]
  1. Department of Materials Science and Mineral Engineering, University of California at Berkeley, Berkeley, California 94720 (United States)
  2. Bell Communications Research, Red Bank, New Jersey 07701 (United States)
  3. IBM Almaden Research Facility, San Jose, California 95120 (United States)
  4. U. S. Army Research Laboratory, Fort Monmouth, New Jersey 07703 (United States)

Epitaxial Y[sub 3]Fe[sub 5]O[sub 12](YIG)/Bi[sub 3]Fe[sub 5]O[sub 12](BIG) and YIG/Eu[sub 1]Bi[sub 2]Fe[sub 5]O[sub 12](EBIG) heterostructures have been grown on [111] oriented single-crystalline gadolinium-gallium-garnet substrates by pulsed laser deposition. The effects of the layer thickness ratios on the composition, microstructure, and magnetic properties of the films have been studied employing x-ray diffraction, Rutherford backscattering spectroscopy, vibration sample magnetometry, and Kerr magnetometry. All films under investigation are single crystalline, in the [111] orientation. The multilayered heterostructures displayed superior magnetic properties in comparison to their single crystalline monolayer counterparts, deposited at the same conditions. The YIG/BIG heterostructures indicate increased in-plane saturation magnetic moments, approaching the maximum saturation value in bulk YIG. The YIG/EBIG heterostructures show a definite reorientation of the magnetic moment in the out-of-plane direction, a new set of increased saturation magnetization values that go even above that recorded for the bulk YIG, as well as an increase in coercivity.

DOE Contract Number:
AC03-76SF00098
OSTI ID:
6955242
Journal Information:
Journal of Applied Physics; (United States), Vol. 76:10; ISSN 0021-8979
Country of Publication:
United States
Language:
English