Experimental considerations of higher order parametric x-rays from silicon crystals of varying thicknesses. Master's thesis
Generation of parametric x-radiation (PXR) may be described as the Bragg scattering of virtual photons to produce real x-rays which satisfy the Bragg condition N lambda = 2d sin theta sub B where theta sub B is the angle between the electron beam and the crystal plane. Enhanced higher order parametric s-radiation from the <220> and the <111> planes of silicon crystals of varying thicknesses were observed, Production of PXR of order n=1 for both planes of a 20 u m thick crystal and orders n=1, and n=2 of the <220> and the n=1, n=3, and n=4 of the <111> planes of the 44 microns and 320 microns crystals were observed. Exploiting the formation and attenuation lengths of silicon crystals of varying thicknesses, higher order x-ray production is enhanced relative to the lower energy first order x-ray. Photons of 4.5 to 21 keV have been observed. Parametric X-Radiation, PXR, Silicon, Linear Accelerator, Bragg Scattering, Crystalography.
- Research Organization:
- Naval Postgraduate School, Monterey, CA (United States)
- OSTI ID:
- 6828023
- Report Number(s):
- AD-A-256082/9/XAB
- Resource Relation:
- Other Information: Master's thesis
- Country of Publication:
- United States
- Language:
- English
Similar Records
Tunable Monochromatic X-ray Source Based on Parametric X-ray Radiation at LEBRA, Nihon University
Observation of Parametric X-Rays Produced by 400-GeV/C Protons in Bent Crystals
Related Subjects
CRYSTALS
BRAGG REFLECTION
PARAMETRIC ANALYSIS
SILICON
ATTENUATION
BENCH-SCALE EXPERIMENTS
LINEAR ACCELERATORS
PHOTONS
PRODUCTION
SCATTERING
THICKNESS
X-RAY DETECTION
X-RAY DIFFRACTION
ACCELERATORS
BOSONS
COHERENT SCATTERING
DETECTION
DIFFRACTION
DIMENSIONS
ELEMENTARY PARTICLES
ELEMENTS
MASSLESS PARTICLES
RADIATION DETECTION
REFLECTION
SEMIMETALS
360602* - Other Materials- Structure & Phase Studies