CVD diamond films for radiation detection
- Centre d'Etudes de Saclay, Gif-sur-Yvette (France)
- Lab. d'Etudes des Proprietes Electroniques des Solides, Grenoble (France)
Diamond films produced by microwave plasma enhanced chemical vapor deposition (CVD) technique have been used to fabricate radiation detectors. The polycrystalline diamond films have a measured resistivity of 10[sup 12] [Omega].cm, a carrier mobility of 280 cm[sup 2]/V.s and a carrier lifetime of about 530 ps. The detector response to laser pulses ([lambda] = 355, 532 and 1,064 nm), X-ray flux (15--50 keV) and alpha particles ([sup 241]Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3 [times] 10[sup [minus]10] A/V. (Gy/s) was measured under 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting.
- OSTI ID:
- 6816006
- Report Number(s):
- CONF-931051-; CODEN: IETNAE; TRN: 94-022987
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 41:4Pt1; Conference: NSS-MIC '93: nuclear science symposium and medical imaging conference, San Francisco, CA (United States), 30 Oct - 6 Nov 1993; ISSN 0018-9499
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ALPHA DETECTION
SEMICONDUCTOR DETECTORS
FABRICATION
PERFORMANCE
X-RAY DETECTION
ELECTRICAL PROPERTIES
EXPERIMENTAL DATA
RESPONSE FUNCTIONS
SENSITIVITY
CHARGED PARTICLE DETECTION
DATA
DETECTION
FUNCTIONS
INFORMATION
MEASURING INSTRUMENTS
NUMERICAL DATA
PHYSICAL PROPERTIES
RADIATION DETECTION
RADIATION DETECTORS
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments