Space charge limits in the AGS booster
Space charge effects are expected to be strong in the AGS booster. The beam intensity may be high enough to cause upsilon-shifts due to space charge of the order of ..delta..upsilon approx. .5. In this paper, space charge effects are studied through the use of a tracking program. At each element of the lattice the particles receive a kick which is proportional to the electric field E/sub x/, E/sub y/ produced by the beam and to the length of the element. The beam growth can be studied using the tracking program to track a sample of the particles and to use the growth found in the tracking to find the charge in the beam shape and in the beam size. The techniques used and the assumptions made in studying beam growth are described in the following sections. Using the results found for the beam growth, one can find the space charge limit which is defined as the beam intensity that causes the beam to grow where it reaches the available aperture limits of the accelerator. Space charge limit results are found for the AGS Booster. For a beam of fixed dimensions, which is not growing, the tracking program allows one to compute various effects, some of which are difficult to compute by analytical means. One can compute the space charge upsilon-shift as a function of the particle momentum and as a function of the particle betatron oscillation amplitude. One can also study the effects due to resonances which are excited by magnetic field imperfections or by the field of the beam itself. This study would include the important effect due to the change in the upsilon-values because of changes in the betatron oscillation amplitude. The case of two dimensional motion could also be studied.
- Research Organization:
- Brookhaven National Lab., Upton, NY (USA)
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 6797090
- Report Number(s):
- BNL-39503; CONF-870302-116; ON: DE87008454
- Resource Relation:
- Conference: Particle accelerator conference, Washington, DC, USA, 16 Mar 1987; Other Information: Paper copy only, copy does not permit microfiche production
- Country of Publication:
- United States
- Language:
- English
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