VISAR (Velocity Interferometer System for Any Reflector): Line-imaging interferometer

Conference · Mon Jan 01 00:00:00 EST 1990

OSTI ID:6706797

Hemsing, W F; Mathews, A R; Warnes, R H; Whittemore, G R

This paper describes a Velocity Interferometer System for Any Reflector (VISAR) technique that extends velocity measurements from single points to a line. Single-frequency argon laser light was focused through a cylindrical lens to illuminate a line on a surface. The initially stationary, flat surface was accelerated unevenly during the experiment. Motion produced a Doppler-shift of light reflected from the surface that was proportional to the velocity at each point. The Doppler-shifted image of the illuminated line was focused from the surface through a push-pull VISAR interferometer where the light was split into four quadrature-coded images. When the surface accelerated, the Doppler-shift caused the interference for each point on each line image to oscillate sinusoidally. Coherent fiber optic bundles transmitted images from the interferometer to an electronic streak camera for sweeping in time and recording on film. Data reduction combined the images to yield a continuous velocity and displacement history for all points on the surface that reflected sufficient light. The technique was demonstrated in an experiment where most of the surface was rapidly driven to a saddle shape by an exploding foil. Computer graphics were used to display the measured velocity history and to aid visualization of the surface motion. 6 refs., 8 figs.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: DOE/DP
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 6706797
• Report Number(s): LA-UR-90-2320; CONF-900756-14; ON: DE90015028
• Resource Relation: Conference: SPIE's international symposium on optical and optoelectronic applied science and engineering exhibit, San Diego, CA (USA), 8-13 Jul 1990
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
FABRY-PEROT INTERFEROMETER
VELOCITY
MEASURING METHODS
ACCELERATION
AMPLITUDES
ARGON
DOPPLER EFFECT
FIBER OPTICS
FOCUSING
IMAGES
LASERS
LENSES
MAPPING
REFLECTIVITY
RESPONSE FUNCTIONS
SIGNAL CONDITIONERS
STREAK CAMERAS
SURFACE PROPERTIES
WAVELENGTHS
CAMERAS
ELECTRONIC CIRCUITS
ELEMENTS
FLUIDS
FUNCTIONS
GASES
INTERFEROMETERS
MEASURING INSTRUMENTS
NONMETALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PULSE CIRCUITS
RADIATION DETECTORS
RARE GASES
440800* - Miscellaneous Instrumentation- (1990-)
440600 - Optical Instrumentation- (1990-)