Tracking and radiation tests of silicon microstrip detectors
- Department of Physics and Astronomy, University of Oklahoma, Norman, Oklahoma 73019 (United States)
- Department of Physics, Yale University, New Haven, Connecticut 06511 (United States)
- Department of Physics and Astronomy, University of Iowa, Iowa City, Iowa 52242 (United States)
We have measured a signal-to-noise of 37:1 at room temperature for 227 GeV pions at Fermilab on the n(ohmic)-side of a Hamamatsu AC-coupled double-sided silicon microstrip detector with 0.64 cm long strips. Position resolutions at normal incidence of 3.5[plus minus]0.4 [mu]m (10.4[plus minus]0.5 [mu]m) were obtained for the p-side (n-side) which had 25 [mu]m (50 [mu]m) pitch and 50 [mu]m readout. The effects of radiation damage on the n-side have also been measured with a [sup 60]Co source. Phase-gain measurements imply that the accumulation layer bias capacitance and AC-coupling capacitance are constant with dose up to 5 Mrad with values of 1.2 pf and 12 pf per strip respectively. The bias resistance per strip has a value of [similar to]0.8 M[Omega] at 0 and 5 Mrad and [similar to]0.4 M[Omega] at doses of 20--100 Krad.
- OSTI ID:
- 6705039
- Report Number(s):
- CONF-920837-; CODEN: APCPCS
- Journal Information:
- AIP Conference Proceedings (American Institute of Physics); (United States), Vol. 272:2; Conference: ICHEP-26: 26th International Union of Pure and Applied Physics (IUPAP) conference on high energy physics, Dallas, TX (United States), 6-12 Aug 1992; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
Similar Records
Microstrip x-ray detector with a very high dynamic range based on LPE-GaAs
Study of 18-cm long single-sided ac-coupled silicon microstrip detectors
Related Subjects
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
RADIATION DETECTORS
GAMMA RADIATION
GEV RANGE 100-1000
MONTE CARLO METHOD
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
SIGNAL-TO-NOISE RATIO
SILICON
TESTING
CALCULATION METHODS
ELECTROMAGNETIC RADIATION
ELEMENTS
ENERGY RANGE
GEV RANGE
IONIZING RADIATIONS
MEASURING INSTRUMENTS
RADIATIONS
SEMIMETALS
440104* - Radiation Instrumentation- High Energy Physics Instrumentation
662420 - Properties of Mesons & Meson Resonances- (1992-)