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Title: An aerial radiological survey of the Kennedy Space Center and Cape Canaveral Air Force Station and surrounding area, Titusville, Florida: Date of survey: October 1985

Technical Report ·
DOI:https://doi.org/10.2172/6683321· OSTI ID:6683321

An aerial radiological survey of the entire Kennedy Space Center (KSC) and Cape Canaveral Air Force Station (CCAFS) was performed during the period 9 through 23 October 1985. This survey was conducted in three parts. First, a low resolution, low sensitivity background survey was performed that encompassed the entire KSC and CCAFS area. Next, two smaller, high resolution, high sensitivity surveys were conducted: the first focused on Launch Complexes 39A and 39B, and the second on the Shuttle Landing Facility. The areas encompassed by the surveys were 200, 5.5, and 8.5 square miles (500, 14, and 22 sq km), respectively. The purpose of these surveys was to provide information useful for an emergency response to a radiological accident. Results of the background survey are presented as isoradiation contour maps of both total exposure rate and man-made gross count superimposed on a mosaic of recent aerial photographs. Results of the two small, detailed surveys are also presented as an isoradiation contour map of exposure rate on the aerial photograph base. These data were evaluated to establish sensitivity limits for mapping the presence of plutonium-238. Natural background exposure rates at the Kennedy Space Center and Cape Canaveral Air Force Station are very low, generally ranging from 4 to 6.5 microroentgens per hour (..mu..R/h) and less than 4 ..mu..R/h in wet areas. However, exposure rates in developed areas were observed to be higher due to the importation of construction materials not characteristic of the area. 8 refs., 3 figs., 4 tabs.

Research Organization:
EG and G Energy Measurements, Inc., Las Vegas, NV (USA)
DOE Contract Number:
AC08-83NV10282
OSTI ID:
6683321
Report Number(s):
EGG-10282-1103; ON: DE89001862
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English