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Title: Charged particle effects on optoelectronic devices and bit error rate measurements on 400 Mbps fiber based data links

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6595025
 [1];  [2];  [3]
  1. Naval Research Lab., Washington, DC (United States) SFA, Inc., Landover, MD (United States)
  2. Naval Research Lab., Washington, DC (United States)
  3. NASA Goddard, Greenbelt, MD (United States)

Proton test results on a fiber optic data link operating at 400 megabits/s (Mbps) are described to elucidate the roles of important variables such as proton angle of entry and the optical signal strength. Interpretation of these data reveals that direct ionization events from protons can result in bit errors, through these effects can be mitigated with increased optical signal strength. The authors explore the consequences of these results to suggest single event tolerant approaches for satellite applications, and conclude that radiation tolerant links and busses can operate in even the most severe orbital environments with acceptable error rates of <10[sup [minus]9].

OSTI ID:
6595025
Report Number(s):
CONF-930953-; CODEN: IETNAE; TRN: 95-004938
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 41:3Pt1; Conference: RADECS '93: 2nd European conference on radiations and their effects on components and systems, Saint Malo (France), 13-16 Sep 1993; ISSN 0018-9499
Country of Publication:
United States
Language:
English