Two Length Scales and Crossover Behavior in the Critical Diffuse Scattering from V{sub 2}H

Journal Article · Tue Sep 01 00:00:00 EDT 1998 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.81.2276· OSTI ID:657813

Trenkler, J; Chow, P C; Abe, H; Bassler, K E; Paniago, R; Reichert, H; Scarfe, D; Moss, S C ^[1]; Wochner, P ^[2]; Metzger, T H; Peisl, J ^[3]; Bai, J ^[4]

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1. Department of Physics, University of Houston, Houston, Texas 77204-5506 (United States)
2. Department of Physics, Brookhaven National Laboratory, Upton, New York 11973 (United States)
3. Sektion Physik, Ludwig-Maximilians-Universitaet, Geschwister-Scholl-Platz 1, 80539 Muenchen (Germany)
4. Oak Ridge Associated Universities, Oak Ridge, Tennessee 37831 (United States)

We have observed two length scales in a V{sub 2}H crystal above the {beta}{sub 1}-{beta}{sub 2} phase transition. A sharp Lorentzian profile in the critical diffuse scattering was superimposed on a broader one for a low-energy x-ray experiment in reflection, while no sharp component appeared in transmission at high energy. For the sharp component, we extracted tricritical exponents {nu}{sub 1} and {gamma}{sub 1} at small reduced temperatures t , where fluctuations are coherent over large distances. For larger t , where the correlation length is comparable to an effective defect size, there is a crossover to altered exponents. {copyright} {ital 1998} {ital The American Physical Society }

• OSTI ID: 657813
• Journal Information: Physical Review Letters, Vol. 81, Issue 11; Other Information: PBD: Sep 1998
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
VANADIUM COMPOUNDS
VANADIUM HYDRIDES
SCALING
ORDER-DISORDER TRANSFORMATIONS
X-RAY DIFFRACTION
INELASTIC SCATTERING
LINE BROADENING
MASS SPECTRA
NSLS
CORRELATION FUNCTIONS
TEMPERATURE DEPENDENCE