A critical evaluation of the effective diffusion length determination in crystalline silicon solar cells from an extended spectral analysis
Journal Article
·
· IEEE Transactions on Electron Devices
- Univ. of Konstanz (Germany). Faculty of Physics
This note draws attention to possible errors when characterizing silicon solar cells by means of the effective minority carrier diffusion length L{sub eff} as defined in the paper on ``Numerical modeling of textured silicon solar cells using PC1D`` by Basore. The approximations underlying the analytical expression for L{sub eff} are critically reviewed. Their impact on the determination of the minority carrier bulk diffusion length L{sub b} from L{sub eff} is discussed for a 250-{micro}m thick Si solar cell. It is found that considerable errors occur in the base of diffusion lengths larger than the cell thickness even when neglecting any measurement uncertainty.
- OSTI ID:
- 638410
- Journal Information:
- IEEE Transactions on Electron Devices, Vol. 45, Issue 7; Other Information: PBD: Jul 1998
- Country of Publication:
- United States
- Language:
- English
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