Application of the finite-element method to the design of high-power beam systems
- Acceleration Associates, Albuquerque, NM (United States)
Ray tracing codes such as EGUN and EBQ have long been essential tools for the design of electron guns, ion extractors, and electro-optical devices. these codes are based on finite-difference field solutions on square or rectangular meshes. this paper describes a new program, TRAK 2.0, that combines ray-tracing with finite-element field solutions. The program incorporates variable-resolution conformal triangular meshes and assignment of space-charge to volume elements. The result is highly improved accuracy for orbit and field calculations, particular near the edges of electrodes. TRAK 2.0 was created as part of an SBIR program managed by Northstar Research Corporation to develop novel electron devices for RF generation and pulsed power modulation. TRAK 2.0 and EMP 3.0 define a complete system for high-power electron device design on 386/486 personal computers. Solutions can include multiple dielectrics and non-linear magnetic materials. TRAK can simultaneously handle combined magnetic and electrical field solutions with different meshes. The program uses high-accuracy space-charge emission algorithms for sources of arbitrary shape. There are also options for flexible creation of beam distributions with user-specified profiles. TRAK gives accurate predictions of relativistic beam dynamics through the use of a supplementary current-density mesh. The program is a turn-key system with Autocad boundary input, extensive output diagnostics, an interactive graphics post-processor, a command shell with mouse support, and output to common hardcopy devices.
- DOE Contract Number:
- FG05-91ER81209
- OSTI ID:
- 63093
- Report Number(s):
- CONF-940604-; ISBN 0-7803-2006-9; TRN: IM9527%%144
- Resource Relation:
- Conference: 1994 Institute of Electrical and Electronic Engineers (IEEE) international conference on plasma science, Santa Fe, NM (United States), 6-8 Jun 1994; Other Information: PBD: 1994; Related Information: Is Part Of 1994 IEEE international conference on plasma science; PB: 252 p.
- Country of Publication:
- United States
- Language:
- English
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