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Title: DLTS analysis and modeling of electron- and proton-irradiated (AlGa)As/GaAs multijunction solar cells. Final report, October 1985-October 1986

Technical Report ·
OSTI ID:6296815

A numerical model was developed to calculate the displacement defects, the damage constant of minority-carrier diffusion length, and the degradation of short-circuit current (I/sub sc/), open circuit voltage (V/sub oc/) and conversion efficiency (eta/sub c/) in the 1-MeV electron- and proton-irradiated AlGaAs/GaAs/InGaAs multijunction solar cell under normal incidence conditions. The results show good agreement between calculated values and the experimental data of I/sub sc/, V/sub oc/ and eta/sub c/. In addition, DLTS analysis of defects in AlGaAs p-n junction solar cells irradiated by 1-MeV electrons has also been carried out in this work. The I-V analysis on several MOCVD-grown Ge/GaAs tunnel junction diodes has also been made in this study.

Research Organization:
Florida Univ., Gainesville (USA). Dept. of Electrical Engineering
OSTI ID:
6296815
Report Number(s):
AD-A-180234/7/XAB
Country of Publication:
United States
Language:
English