Chemical probes of charge transfer at semiconductor/liquid junctions. Technical report, January 16, 1985-January 15, 1986
We attempted to obtain quantitative, non-mass-transfer limited current density vs. potential relationships for a select group of metallocenes. A reproducible procedure for poising the solution redox potential and measuring currents in stirred solutions was developed as well as software programs for data analysis and graphical representation. Even though both p-type and n-type InP electrodes exhibit regions of relative stability, it now appears that this material will not be suitable for detailed kinetic studies. The currents seem to be dominated by leakage phenomena and changes in the thickness of surface oxide which tend to obscure redox processes inherent to the semiconductor solution interface itself.
- Research Organization:
- Colorado Univ., Boulder (USA)
- DOE Contract Number:
- FG02-84ER13247
- OSTI ID:
- 6269543
- Report Number(s):
- DOE/ER/13247-2; ON: DE86005744
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ELECTRODES
CHEMICAL PREPARATION
REACTION KINETICS
INDIUM PHOSPHIDES
TUNGSTEN SELENIDES
ELECTRON TRANSFER
ENTROPY
N-TYPE CONDUCTORS
ORGANOMETALLIC COMPOUNDS
P-TYPE CONDUCTORS
CHALCOGENIDES
INDIUM COMPOUNDS
KINETICS
MATERIALS
ORGANIC COMPOUNDS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
REFRACTORY METAL COMPOUNDS
SELENIDES
SELENIUM COMPOUNDS
SEMICONDUCTOR MATERIALS
SYNTHESIS
THERMODYNAMIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN COMPOUNDS
400400* - Electrochemistry