One-sided imaging of large, dense objects using 511-keV photons from induced-pair production

Journal Article · Mon Jun 01 00:00:00 EDT 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.682689· OSTI ID:624238

Tavora, L M.N.; Gilboy, W B; Morton, E J ^[1]; Morgado, R E; Estep, R J; Rawool-Sullivan, M ^[2]

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1. Univ. of Surrey (United Kingdom)
2. Los Alamos National Lab., NM (United States)

This work investigates the use of annihilation photons from gamma-ray-induced electron-positron pair production to inspect objects when only one side is accessible. The Z{sup 2}-dependence of the pair-production cross section and the high penetration of 511-keV photons allow this method to differentiate high-Z materials in low-Z matrices. The experimental results for the dependence of the back-streaming photon yield on Z shows a factor of 20 increase for elements over the range 4 < Z < 82. Results for point-by-point images obtained in line scans of representative geometries are also shown. Comparisons of experimental data and simulation studies based on the EGS4 Monte Carlo code agree to within 5%.

• OSTI ID: 624238
• Report Number(s): CONF-971147-; ISSN 0018-9499; TRN: 98:006492
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 45, Issue 3Pt1; Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Albuquerque, NM (United States), 11-13 Nov 1997; Other Information: PBD: Jun 1998
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
NONDESTRUCTIVE ANALYSIS
GAMMA RADIATION
PAIR PRODUCTION
ATOMIC NUMBER
ELECTRON PAIRS
ANNIHILATION