Physical characterization of Pb{sub 1}Zr{sub 0.2}Ti{sub 0.8}O{sub 3} prepared by the sol-gel process
- Auburn Univ., AL (United States)
- National Univ. of Singapore (Singapore). Dept. of Physics
- Motorola Inc., Austin, TX (United States). Advanced Products Research and Development Lab.
The authors have used Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and Rutherford backscattering spectroscopy (RBS) to characterize lead zirconate-lead titanate (PbZrO{sub 3}-PbTiO{sub 3}) of stoichiometry Pb{sub 1}Zr{sub 0.2}Ti{sub 0.8}O{sub 3} prepared by the sol-gel process. The films were deposited on a sputtered film of Pt and annealed at 700 C for 30 min. Dramatic AES and XPS chemical effects are observed in the film due to charge transfer between Ti and Zr and O; the binding energy of the PZT XPS Ti2p{sub 3/2} (Zr3d{sub 5/2}) orbital shifts +5.2 eV (+4.3 eV) compared to the element and substantial shape changes are observed in the AES Ti(LMM) and O(KLL) peaks. Raman spectroscopy at both 300 and 80 K show that mode frequencies shift upward with decreasing temperature in accord with soft mode theory. Rutherford backscattering spectroscopy (RBS) indicates that the stoichiometry of Pb{sub 1}Zr{sub 0.2}Ti{sub 0.8}O{sub 3} on Pt changes little during 700 C thermal annealing in oxygen because the oxygen from the gas phase replaces the oxygen lost to the substrate by thermal diffusion.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 61504
- Journal Information:
- Journal of the Electrochemical Society, Vol. 142, Issue 2; Other Information: PBD: Feb 1995
- Country of Publication:
- United States
- Language:
- English
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