skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Varied line-space gratings: past, present and future

Conference ·
OSTI ID:6111273

A classically ruled diffraction grating consists of grooves which are equidistant, straight and parallel. Conversely, the so-called ''holographic'' grating (formed by the interfering waves of coherent visible light), although severely constrained by the recording wavelength and recording geometry, has grooves which are typically neither equidistant, straight nor parallel. In contrast, a varied line-space (VLS) grating, in common nomenclature, is a design in which the groove positions are relatively unconstrained yet possess sufficient symmetry to permit mechanical ruling. Such seemingly exotic gratings are no longer only a theoretical curiosity, but have been ruled and used in a wide variety of applications. These include: (1) aberration-corrected normal incidence concave gratings for Seya-Namioka monochromators and optical de-multiplexers, (2) flat-field grazing incidence concave gratings for plasma diagnostics, (3) aberration-corrected grazing incidence plane gratings for space-borne spectrometers, (4) focusing grazing incidence plane grating for synchrotron radiation monochromators, and (5) wavefront generators for visible interferometry of optical surfaces (particularly aspheres). Future prospects of VLS gratings as dispersing elements, wavefront correctors and beamsplitters appear promising. The author discusses the history of VLS gratings, their present applications, and their potential in the future. 61 refs., 24 figs.

Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
6111273
Report Number(s):
LBL-20115; CONF-850887-44; ON: DE86007498; TRN: 87-024804
Resource Relation:
Conference: SPIE international technical symposium on optical and electro-optical engineers, San Diego, CA, USA, 18 Aug 1985; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English