Secondary emission detectors for fixed target experiments at Fermilab

Conference · Sun Feb 01 00:00:00 EST 1998

OSTI ID:603074

Drucker, R; Ford, R; Tassotto, G

A description of a Secondary Emission Electron Detector (SEED) is given. The SEEDs provide accurate profiles and positions at small wire spacing (125-500 mm) in a high energy, high rate environment that exceeds the capabilities of traditional segmented wire ion chambers (SWICs). This device has been designed and constructed to monitor beam position and profile of two fixed target beamlines, namely, KTeV (FNAL E-799, E-832) with an average beam sigma at target of 0.22 mm and NuTeV (FNAL E-815) with a sigma = 0.6 mm. KTeV took beam at an intensity of up to 5E12 800 GeV protons over a 20 sec spill and NuTeV received 1E13 800 GeV protons in five pings/spill.

• Research Organization: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
• Sponsoring Organization: USDOE Office of Energy Research, Washington, DC (United States)
• DOE Contract Number: AC02-76CH03000
• OSTI ID: 603074
• Report Number(s): FNAL/C-98/062; CONF-9710219-; ON: DE98052909; BR: KA HEP; TRN: 98:006903
• Resource Relation: Conference: Beam diagnostics and instrumentation for particle accelerators, Frascati (Italy), 12-14 Oct 1997; Other Information: PBD: Feb 1998
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
SECONDARY EMISSION DETECTORS
DESIGN
RESOLUTION
STABILITY
TESTING