X-ray Tomographic Microscopy (XTM)

Conference · Mon Oct 01 00:00:00 EDT 1990

OSTI ID:5859226

Celeste, J

X-ray tomographic microscopy (XTM) is a high resolution, three dimensional computed tomography (CT) system with a spatial resolution better that 0.005 mm. With this resolution it is now possible to image the microstructure of materials in millimeter-size samples. XTM differs from conventional optical and electron-beam microscopy in that the sample need not be harmed prior to characterization. There is no requirement for flat optical surfaces or thin sections. Materials are examined in their unaltered state. The three-dimensional imaging capability makes XTM ideally suited for materials research. In XTM, the x-ray attenuation coefficient at any location in a material is determined from a finite set of x-ray attenuation measurements (projection data) taken at different angles. The projection data is the transmitted x-ray intensity reaching a position-sensitive detector after passing through the sample. The data for reach angular view is stored and the three-dimensional image is generated by tomographic reconstruction techniques. The attenuation coefficient is directly related to material chemistry and density. High spatial resolution is required to provide microstructure information in the region of interest. 1 fig.

• Research Organization: Lawrence Livermore National Lab., CA (USA)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (USA)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5859226
• Report Number(s): UCRL-JC-105138; CONF-9105166-5; ON: DE91011930
• Resource Relation: Conference: 2. American Society for Nondestructive Testing (ASNT) on industrial computed tomography conference, San Diego, CA (USA), 20-24 May 1991
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
MICROSCOPES
DESIGN
PHOTON COMPUTED TOMOGRAPHY
CADMIUM TUNGSTATES
CAMERAS
DATA ACQUISITION SYSTEMS
IMAGE PROCESSING
MICROSCOPY
MICROSTRUCTURE
NONDESTRUCTIVE TESTING
OPTICAL SYSTEMS
SENSITIVITY
SOLID SCINTILLATION DETECTORS
SPATIAL RESOLUTION
X RADIATION
X-RAY SOURCES
CADMIUM COMPOUNDS
COMPUTERIZED TOMOGRAPHY
CRYSTAL STRUCTURE
DIAGNOSTIC TECHNIQUES
ELECTROMAGNETIC RADIATION
EQUIPMENT
INORGANIC PHOSPHORS
IONIZING RADIATIONS
MATERIALS TESTING
MEASURING INSTRUMENTS
PHOSPHORS
PROCESSING
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
RESOLUTION
SCINTILLATION COUNTERS
TESTING
TOMOGRAPHY
TUNGSTATES
X-RAY EQUIPMENT
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments
400102 - Chemical & Spectral Procedures