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Title: X-ray diffraction study of fullerene soot

Journal Article · · Journal of Physical Chemistry; (United States)
DOI:https://doi.org/10.1021/j100130a004· OSTI ID:5771308
 [1];  [2]
  1. Exxon Corporate Research Lab., Annandale, NJ (United States)
  2. Univ. of Chicago, IL (United States)

The X-ray diffraction pattern of pure buckminsterfullerene (C[sub 60]) is compared to that of exhaustively toluene-extracted fullerene soot. Both show diffraction lines which may be indexed to the 1.420 [+-] 0.005 nm cubic lattice of C[sub 60]. Additionally, the extracted fullerene soot shows diffraction peaks which may be indexed as the (002), (004), (100), (110), and (112) peaks of a planar benzenoid lattice. The coefficients of thermal expansion for the (311) peak of the C[sub 60] lattice and the (002) peak of the planar benzenoid lattice are both 3 [times] 10[sup [minus]5] [degree]C[sup [minus]1], which is the value of the (002) peak of graphite. Both phases of the extracted fullerene soot change on exposure to air at 600[degree]C: the C[sub 60] phase vanishes, and the in-plane component of the benzenoid phase grows. 22 refs., 3 figs.

OSTI ID:
5771308
Journal Information:
Journal of Physical Chemistry; (United States), Vol. 97:28; ISSN 0022-3654
Country of Publication:
United States
Language:
English