A monolithic, 2. mu. m CMOS constant-fraction discriminator for moderate time resolution systems

Journal Article · Sun Dec 01 00:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/TNS.1991.574225· OSTI ID:5705991

Binkley, D M ^[1]; Simpson, M L ^[2]; Rochelle, J M ^[3]

---

1. CTI, Inc., Knoxville, TN (US)
2. EG and G ORTEC, Oak Ridge, TN (US)
3. Tennessee Univ., Knoxville, TN (United States). Dept. of Electrical Engineering

This paper reports on a monolithic, 2 {mu}m CMOS constant-fraction discriminator (CFD) that was developed for use with moderate time resolution (about 4 ns FWHM) scintillation detectors such as BGO. The circuit was fabricated through the metal-oxide-semiconductor implementation service (MOSIS) using a double-metal, double- polysilicon digital process. The measured CFD walk is 1.4 ns total for input signals of {minus}200 to {minus}2000 mV with risetimes of 20 ns. Additionally, the measured CFD noise jitter is 70 ps FWHM for {minus}200 mV, 20 ns risetime signals. Measured timing performance of the CFD circuit with a BGO scintillation detector shows good performance for detectors with timing resolutions in the 4 ns FWHM range. A general-purpose comparator, included on the same die as the CFD for separate evaluation, has measured response times of 32 ns for a 50 mV overdrive input and 23 ns for a 500 mV overdrive input. Both the CFD and the general-purpose comparator have application in large multichannel systems, including positron-emission tomography (PET), where circuit size and power consumption are limited for each system channel.

• OSTI ID: 5705991
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 38:6; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DISCRIMINATORS
FABRICATION
SCINTILLATION COUNTERS
ELECTRONIC CIRCUITS
EMISSION
MOS TRANSISTORS
NEAR INFRARED RADIATION
PERFORMANCE
POSITRONS
SIGNAL-TO-NOISE RATIO
TIME RESOLUTION
TOMOGRAPHY
USES
ANTILEPTONS
ANTIMATTER
ANTIPARTICLES
DIAGNOSTIC TECHNIQUES
ELECTROMAGNETIC RADIATION
ELEMENTARY PARTICLES
FERMIONS
INFRARED RADIATION
LEPTONS
MATTER
MEASURING INSTRUMENTS
RADIATION DETECTORS
RADIATIONS
RESOLUTION
SEMICONDUCTOR DEVICES
TIMING PROPERTIES
TRANSISTORS
426000* - Engineering- Components
Electron Devices & Circuits- (1990-)
440104 - Radiation Instrumentation- High Energy Physics Instrumentation