ORNL 10-m small-angle X-ray scattering camera
A new small-angle x-ray scattering camera utilizing a rotating anode x-ray source, crystal monochromatization of the incident beam, pinhole collimation, and a two-dimensional position-sensitive proportional counter was developed. The sample, and the resolution element of the detector are each approximately 1 x 1 mm/sup 2/, the camera was designed so that the focal spot-to-sample and sample-to-detector distances may each be varied in 0.5-m increments up to 5 m to provide a system resolution in the range 0.5 to 4.0 mrad. A large, general-purpose specimen chamber has been provided into which a wide variety of special-purpose specimen holders can be mounted. The detector has an active area of 200 x 200 mm and has up to 200 x 200 resolution elements. The data are recorded in the memory of a minicomputer by a high-speed interface which uses a microprocessor to map the position of an incident photon into an absolute minicomputer memory address. The data recorded in the computer memory can be processed on-line by a variety of programs designed to enhance the user's interaction with the experiment. At the highest angular resolution (0.4 mrad), the flux incident on the specimen is 1.0 x 10/sup 6/ photons/s with the x-ray source operating at 45 kV and 100 mA. SAX and its associated programs OVF and MOT are high-priority, pre-queued, nonresident foreground tasks which run under the ModComp II MAX III operating system to provide complete user control of the ORNL 10-m small-angle x-ray scattering camera.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- DOE Contract Number:
- W-7405-ENG-26
- OSTI ID:
- 5575381
- Report Number(s):
- ORNL/TM-6342; TRN: 80-002620
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
X-RAY DIFFRACTOMETERS
CONTROL SYSTEMS
DESIGN
OPERATION
COLLIMATORS
INTERFACES
M CODES
MICROPROCESSORS
MONOCHROMATORS
O CODES
PROPORTIONAL COUNTERS
S CODES
X-RAY DETECTION
X-RAY SOURCES
COMPUTER CODES
DETECTION
DIFFRACTOMETERS
MEASURING INSTRUMENTS
RADIATION DETECTION
RADIATION DETECTORS
RADIATION SOURCES
X-RAY EQUIPMENT
440103* - Radiation Instrumentation- Nuclear Spectroscopic Instrumentation