X-ray calibration: Techniques, sources, and detectors; Proceedings of the Meeting, San Diego, CA, Aug. 19, 20, 1986

Conference · Wed Jan 01 00:00:00 EST 1986

OSTI ID:5522693

Rockett, P D; Lee, P

Papers are presented on absolute intensity measurements in the vacuum UV; a Penning discharge source for EUV calibration; a laser produced plasma XUV radiation source; a variable pressure ion chamber for relative and absolute flux measurements; calibration of a 1-m diameter normal incidence EUV telescope/spectrometer; VUV spectrometer-detector system calibration using synchrotron radiation; and Wolter X-ray microscope calibration. Consideration is given to techniques of absolute low energy X-ray calibration; the evaluation of gratings for the Extreme UV Explorer (EUVE); soft X-ray calibration of diffracting materials; and the calibration of the thin film filters for the EUVE. Topics discussed include facilities and techniques for X-ray diagnostic calibration in the 100 eV to 100 KeV energy range; XUV radiometric standards at NBS; Los Alamos X-ray characterization facilities for plasma diagnostics; the calibration of solar EUV instrumentation in space; and direct X-ray response of charge-coupled devices and photodiode linear arrays.

• OSTI ID: 5522693
• Report Number(s): CONF-860880-
• Resource Relation: Conference: 30. SPIE technical symposium on optics and optoelectronic engineering, San Diego, CA, USA, 17 Aug 1986; Related Information: SPIE Proceedings. Volume 689
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
ULTRAVIOLET RADIATION
CALIBRATION
X RADIATION
BREMSSTRAHLUNG
CHARGE-COUPLED DEVICES
FAR ULTRAVIOLET RADIATION
LASER-PRODUCED PLASMA
LEADING ABSTRACT
MEETINGS
MICROSCOPES
PLASMA DIAGNOSTICS
POINT SOURCES
PROPORTIONAL COUNTERS
SPECTROMETERS
STANDARDS
SYNCHROTRON RADIATION
TELESCOPES
TOKAMAK DEVICES
USES
X-RAY DIFFRACTION
X-RAY SOURCES
ABSTRACTS
CLOSED PLASMA DEVICES
COHERENT SCATTERING
DIFFRACTION
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
MEASURING INSTRUMENTS
PLASMA
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
SCATTERING
SEMICONDUCTOR DEVICES
THERMONUCLEAR DEVICES
X-RAY EQUIPMENT
440300* - Miscellaneous Instruments- (-1989)