skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: KrF laser induced absorption in synthetic fused silica

Conference ·
OSTI ID:552252
;  [1]
  1. Heraeus Quarzglas GmbH, Hanau (Germany)

In order to estimate the long-term behaviour of synthetic fused silica under 248 nm irradiation. KrF laser beam transmission has been measured on 40 cm long samples. Due to this long optical path length, the measuring sensitivity for induced absorption is high enough to apply relatively low pulse energy densities in the range from 100 mJ/cm{sup 2} down to 15 mJ/cm{sup 2}. The maximum number of pulses was 750 million with a repetition rate of 1000 Hz. The damage behaviours (induced absorption versus number of pulses) of the two synthetic fused silica types Suprasil{reg_sign} 2 and Suprasil{reg_sign} 312 differ markedly. Suprasil{reg_sign} 2 exhibits a rapid damage process at the beginning of irradiation followed by a slower linear absorption increase afterwards and the {open_quote}strong absorption transition{close_quote} (SAT. reported by D. Krajnovich et. al.). Induced absorption in Suprasil{reg_sign} 312 increases s-shape like during irradiation reaching a plateau level for higher number of pulses. We describe both damage behaviours with phenomenological model equations. These are used to extrapolate to parameter ranges, that can not be investigated easily (e.g. higher number of pulses, lower pulse energy densities).

Research Organization:
International Society for Optical Engineering, Washington, DC (United States)
OSTI ID:
552252
Report Number(s):
CONF-961070-Vol.2966; CNN: Project E 232; TRN: 98:009061
Resource Relation:
Conference: 28. annual symposium on optical materials for high power lasers - Boulder damage symposium, Boulder, CO (United States), 7-9 Oct 1996; Other Information: PBD: [1997]; Related Information: Is Part Of Laser-induced damage in optical materials: 1996. Twenty-eighth annual Boulder damage symposium, proceedings; Bennett, H.E.; Guenther, A.H.; Kozlowski, M.R.; Newnam, B.E.; Soileau, M.J. [eds.]; PB: 686 p.
Country of Publication:
United States
Language:
English