High-resolution x-ray imaging of planar foils irradiated by the Nike KrF laser
- Naval Research Laboratory, Washington, D.C. 20375 (United States)
- Science Applications International Corporation, McLean, Virginia 22102 (United States)
- SFA Inc., 1401 McCormick Drive, Landover, Maryland 20785 (United States)
Thin plastic (CH) foils were irradiated by the Naval Research Laboratory Nike [Obenschain {ital et al.}, Phys. Plasmas {bold 3}, 2098 (1996)] KrF laser and were imaged in the x-ray and extreme ultraviolet regions with two-dimensional spatial resolution in the 3{endash}10 {mu}m range. The CH foils were backlit by a silicon plasma. A spherically curved quartz crystal produced monochromatic images of the Si{sup +12} resonance line radiation with energy 1865 eV that was transmitted by the CH foils. Instabilities that were seeded by linear ripple patterns on the irradiated sides of CH foils were observed. The ripple patterns had periods in the 31{endash}125 {mu}m range and amplitudes in the 0.25{endash}5.0 {mu}m range. The silicon backlighter emission was recorded by an x-ray spectrometer, and the 1865 eV resonance line emission was recorded by a fast x-ray diode. The multilayer mirror telescope recorded images of the C{sup +3} 1550 {Angstrom} emission (energy 8.0 eV) from the backside of the CH foils. {copyright} {ital 1997 American Institute of Physics.}
- OSTI ID:
- 544572
- Journal Information:
- Physics of Plasmas, Vol. 4, Issue 5; Other Information: PBD: May 1997
- Country of Publication:
- United States
- Language:
- English
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