High energy SEU test results for the commercially available MIPS R3000 microprocessor and R3010 floating point unit

Technical Report · Thu Aug 15 00:00:00 EDT 1991

OSTI ID:5330748

Shaeffer, D L; Kimbrough, J R; Denton, S M; Kaschimitter, J L; Wilburn, J W; Davis, R W; Colella, N J ^[1]; Holtkamp, D B ^[2]

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1. Lawrence Livermore National Lab., CA (United States)
2. Los Alamos National Lab., NM (United States)

Single event upset (SEU) cross sections and total dose hardness of commercially available MIPS R3000 microprocessors (CPU) and R3010 floating point units (FPU) were obtained by exposing these parts to 256 MeV protons from the linear accelerator (LINAC) at the Los Alamos Meson Physics Facility (LAMPF). Parts from several manufacturers were tested. The CPUs and FPUs were tested dynamically during radiation exposure with specially designed assembly language codes which exercised a subset of the available instructions in order to simulate the actual operation of each part. Cross sections derived from the SEU data were used to calculate expected upset rate for a 500-km orbit during quiet solar conditions, the King 1972 solar flare, and the August 4, 1972, event modeled by Adams et al. 16 refs., 16 figs., 3 tabs.

• Research Organization: Lawrence Livermore National Lab., CA (United States)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5330748
• Report Number(s): UCRL-ID-107566; ON: DE91019019
• Country of Publication: United States
• Language: English

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