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Title: Current-carrying states in superconducting multilayers with Josephson interlayer coupling for temperatures close to T{sub c0}: A microscopic theory

Journal Article · · Physical Review, B: Condensed Matter
 [1];  [2]
  1. Department of Physics, Kharkov State University, 310077 Kharkov (Ukraine)
  2. Institute for Single Crystals, 310164 Kharkov (Ukraine)

We present a complete, self-consistent, microscopic description of current-carrying states in all sorts of superconducting multilayers with interlayer Josephson coupling near the bulk critical temperature, T{sub c0}: superconductor-insulator (SI) superlattices with or without intrabarrier exchange interactions and nonmagnetic impurities inside superconducting (S) layers, pure structures with point-contact-type interlayer coupling, superconductor{endash}normal-metal (SN) superlattices with an arbitrary concentration of nonmagnetic impurities, and SN superlattices in the dirty limit with paramagnetic impurities inside N barriers. We have obtained closed analytical expressions for the Josephson current as a function of an S layer thickness, a. For all these systems drastic deviations from a single-junction case were found: a reduction of the critical Josephson current j{sub c} for pure SI superlattices with a{le}{xi}{sub 0}, nontrivial current-phase dependence for multilayers with point-contact-type coupling and a{le}{xi}{sub 0}, and nontrivial temperature dependence of j{sub c} for SN superlattices. Mathematically, our approach is based solely on the use of a microscopic free-energy functional. For a{gt}{xi}{sub 0}, we reduce this functional to a Ginzburg-Landau-type functional with an extra term accounting for the interface free energy. For SI superlattices, in an appropriate limit this latter reduces to a Lawrence-Doniach-type functional with microscopically defined coefficients. {copyright} {ital 1997} {ital The American Physical Society}

OSTI ID:
528083
Journal Information:
Physical Review, B: Condensed Matter, Vol. 56, Issue 5; Other Information: PBD: Aug 1997
Country of Publication:
United States
Language:
English