Cross-sectional observations by HRTEM of the structure of nickel oxide electrochromic thin films in the as-deposited state and the bleached state
- National Industrial Research Inst. of Nagoya (Japan). Multifunctional Material Science Dept.
To investigate the microstructure of nickel oxide electrochromic thin films prepared by reactive DC magnetron sputtering, cross-sectional observations of sputtered nickel oxide films have been performed using a high resolution electron microscope. High resolution images were observed for as-deposited and bleached samples. These images show that the surface morphology of these samples is quite different. The bleached sample consists of needle-like microcrystallites, while the as-deposited sample consists of columnar crystals and has a smooth surface. Diffraction patterns indicate that crystallized NiO is the dominant structure in both samples. The fact that no trace of Ni(OH){sub 2} was observed implies that the boundary and the surface of NiO microcrystallites play important roles in the electrochromic reaction.
- OSTI ID:
- 514722
- Journal Information:
- Materials Research Bulletin, Vol. 32, Issue 7; Other Information: PBD: Jul 1997
- Country of Publication:
- United States
- Language:
- English
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