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Title: Effects of heavy impurity doping on electron injection in p/sup +/-n GaAs diodes

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.99529· OSTI ID:5081122

Measurements of electron injection currents in p/sup +/-n diodes are presented for a range of p-type dopant concentrations. A successive etch technique was used to characterize the electron injection current in terms of the product (n/sub o/D/sub n/). Measurements are presented for Zn-doped GaAs solar cells with p-layer hole concentrations in the range 6.3 x 10/sup 17/-1.3 x 10/sup 19/ cm/sup -3/. The results demonstrate that so-called band-gap narrowing effects substantially increase the injected electron current in heavily doped p-type GaAs. These heavy doping effects must be accounted for in the modeling and design of GaAs solar cells and heterostructure bipolar transistors.

Research Organization:
School of Electrical Engineering, Purdue University, West Lafayette, Indiana 47907
OSTI ID:
5081122
Journal Information:
Appl. Phys. Lett.; (United States), Vol. 52:26
Country of Publication:
United States
Language:
English