Nuclear track formation and track applications at GSI Darmstadt

Conference · Tue Nov 01 00:00:00 EST 1983 · Nucl. Sci. Appl.; (United States)

OSTI ID:5032887

Spohr, R ^[1]

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1. Gesellschaft fuer Schwerionenforschung m.b.H., Darmstadt (Germany, F.R.)

Heavy ion tracks in dielectric materials can be chemically 'amplified' by an etching process that transforms the latent tracks into extremely fine channels. Etched track diameters start around 10 nm and increase linearly with the etching time. In contrast to all other techniques, a single particle is sufficient to create a developable damage. This opens the way for a single-particle structuring tool with a wide range of applications.

• OSTI ID: 5032887
• Report Number(s): CONF-8205258-
• Journal Information: Nucl. Sci. Appl.; (United States), Vol. 1:6; Conference: Non-nuclear physics meeting, Caen, France, 24 May 1982
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIELECTRIC TRACK DETECTORS
ETCHING
ION DETECTION
DIELECTRIC MATERIALS
HEAVY IONS
INTERSTITIALS
ION BEAMS
LATENT IMAGES
PARTICLE TRACKS
PHYSICAL RADIATION EFFECTS
USES
VACANCIES
BEAMS
CHARGED PARTICLE DETECTION
CHARGED PARTICLES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DETECTION
IONS
MATERIALS
MEASURING INSTRUMENTS
POINT DEFECTS
RADIATION DETECTION
RADIATION DETECTORS
RADIATION EFFECTS
SURFACE FINISHING
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments