Stress in sputtered Co{sub 90}Fe{sub 10}/Ag GMR multilayers
- Univ. of Alabama, Tuscaloosa, AL (United States)
Stress, giant magnetoresistance (GMR), structure, and magnetic properties of sputtered (Co{sub 90}Fe{sub 10}X {angstrom}/Ag Y {angstrom})x20 multilayer films have been investigated at room temperature where X ranges from 7.5 to 25 {angstrom} and Y from 10 to 60 {angstrom}. These films exhibit distinct GMR behaviors dependent on individual layer thicknesses, including layered granular-type GMR in CoFe 7.5 {angstrom} samples and discontinuous GMR (DGMR) in CoFe 15 and 25 {angstrom} samples with Ag thicknesses over 30 {angstrom}. No antiferromagnetic coupling was observed. CoFe 10 {angstrom} samples act as a transition between GMR behaviors. Compressive stress decreases with increasing Ag thickness in the CoFe 7.5 {angstrom} samples. In the CoFe 15 and 25 {angstrom} samples the stress fluctuates similarly depending on Ag thickness. The difference in stress and MR behavior between the CoFe 7.5 {angstrom} and the 15 and 25 {angstrom} samples is thought to be due to incomplete CoFe layering in the CoFe 7.5 {angstrom} samples. In the CoFe 15 {angstrom} DGMR samples, high temperature annealing resulted in tensile stresses large enough to cause film detachment. X-ray diffraction reveals a strong (111) growth texture as well as satellite peaks from coherent layering. This (111) texture is also evidenced by patterns with hexagonal symmetry formed by the detached films.
- Sponsoring Organization:
- National Science Foundation, Washington, DC (United States)
- OSTI ID:
- 467631
- Report Number(s):
- CONF-960401-; ISBN 1-55899-339-8; TRN: IM9721%%59
- Resource Relation:
- Conference: Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996; Other Information: PBD: 1997; Related Information: Is Part Of Thin films: Stresses and mechanical properties VI; Gerberich, W.W. [ed.] [Univ. of Minnesota, Minneapolis, MN (United States)]; Gao, H. [ed.] [Stanford Univ., CA (United States)]; Sundgren, J.E. [ed.] [Linkoeping Univ. (Sweden)]; Baker, S.P. [ed.] [Max-Planck-Inst. fuer Metallforschung, Stuttgart (Germany)]; PB: 559 p.; Materials Research Society symposium proceedings, Volume 436
- Country of Publication:
- United States
- Language:
- English
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