Characterization of X-ray streak cameras for use on Nova
- Lawrence Livermore National Lab., CA (United States)
- Kentech Instruments Ltd., Didcot (United Kingdom)
There are many different types of measurements that require a continuous time history of x-ray emission that can be provided with an x-ray streak camera. In order to properly analyze the images that are recorded with the x-ray streak cameras operated on Nova, it is important to account for the streak characterization of each camera. We have performed a number of calibrations of the streak cameras both on the bench as well as with Nova disk target shots where we use a time modulated laser intensity profile (self-beating of the laser) on the target to generate an x-ray comb. We have measured the streak camera sweep direction and spatial offset, curvature of the electron optics, sweep rate, and magnification and resolution of the electron optics.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 464049
- Report Number(s):
- UCRL-JC-123776-Rev.1; CONF-9610181-11; ON: DE97051645; TRN: 97:010092
- Resource Relation:
- Conference: 22. international congress on high speed photography and photonics, Santa Fe, NM (United States), 28 Oct 1996; Other Information: PBD: Sep 1996
- Country of Publication:
- United States
- Language:
- English
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