Determination of the flouride concentration profile in tooth enamel using a nuclear resonance technique

Journal Article · Sat Dec 01 00:00:00 EST 1973 · Thin Solid Films

DOI:https://doi.org/10.1016/0040-6090(73)90033-3· OSTI ID:4415972

Mandler, John W.; Moler, Robert B.; Raisen, Elliott; Rajan, K. S.

The¹⁹F(p, sigma )¹⁶O reaction was used to measure the concentratton profile of fluorine in tooth enamel. By observing the characteristic 6.12 MeV gamma ray with a bigh resolution Ge(Li) detector, the fluorine concentration was measured to a depth of 2.1 Vm in teeth treated with K₂ZrF₆, NaF and acidulated fluorophosphate. The differential depth resolntion was better than 0.1 mu m at the surface of the teeth. Additional information on the average elemental concentration within the first 2 mu m was obtained by observing the characteristic x-rays produced by 1.6 MeV protons. The exploratory data developed in this study have indicated that the highest uptake of fluoride was achieved through the application of K₂/ZrF₆.

• Research Organization: IIT Research Inst., Chicago
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-009764
• OSTI ID: 4415972
• Journal Information: Thin Solid Films, Vol. 19, Issue 1; Other Information: Orig. Receipt Date: 30-JUN-74; ISSN 0040-6090
• Publisher: Elsevier
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
*FLUORINE- NUCLEAR REACTION ANALYSIS
*TEETH- X-RAY FLUORESCENCE ANALYSIS
FLUORINE COMPOUNDS
NONDESTRUCTIVE ANALYSIS
PHOSPHATES
POTASSIUM
PROTON BEAMS
QUANTITATIVE CHEMICAL ANALYSIS
SODIUM FLUORIDES
ZIRCONIUM FLUORIDES