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Title: Ion beam induced surface graphitization of CVD diamond for x-ray beam position monitor applications

Conference ·
OSTI ID:434345
; ;  [1]; ;  [2]
  1. Argonne National Lab, IL (United States). Advanced Photon Source
  2. Argonne National Lab., IL (United States). Materials Science Div.

The Advanced Photon Source at ANL is a third-generation synchrotron facility that generates powerful x-ray beams on its undulator beamlines. It is important to know the position and angle of the x- ray beam during experiments. Due to very high heat flux levels, several patented x-ray beam position monitors (XBPM) exploiting chemical vapor deposition (CVD) diamond have been developed. These XBPMs have a thin layer of low-atomic-mass metallic coating so that photoemission from the x rays generate a minute but measurable current for position determination. Graphitization of the CVD diamond surface creates a very thin, intrinsic and conducting layer that can stand much higher temperatures and minimal x-ray transmission losses compared to the coated metallic layers. In this paper, a laboratory sputter ion source was used to transform selected surfaces of a CVD diamond substrate into graphite. The effect of 1-5 keV argon ion bombardment on CVD diamond surfaces at various target temperatures from 200 to 500 C was studied using Auger electron spectroscopy and in-situ electrical resistivity measurements. Graphitization after the ion bombardment has been confirmed and optimum conditions for graphitization studied. Raman spectroscopy was used to identify the overall diamond structure in the bulk of CVD diamond substrate after the ion bombardments. It was found that target temperature plays an important role in stability and electrical conductivity of the irradiated CVD diamonds.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
434345
Report Number(s):
ANL/XFD/CP-90145; CONF-961002-5; ON: DE97001399
Resource Relation:
Conference: 43. national symposium of the American Vacuum Society (AVS), Philadelphia, PA (United States), 14-18 Oct 1996; Other Information: PBD: [1996]
Country of Publication:
United States
Language:
English

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