Irradiation of quench protection diodes at cryogenic temperatures in a nuclear research reactor
- CERN, Geneva (Switzerland)
- Technical Univ. Munich, Garching (Germany)
Within the framework of the Large Hadron Collider (LHC) R&D programme, CERN and the Department of Physics E21 of the Technical University Munich have established a collaboration to carry out irradiation experiments at liquid helium and liquid nitrogen temperatures on epitaxial diodes for the superconducting magnet protection. Small diode samples of 10 mm wafer diameter from two different manufacturers were submitted to doses of up 50 kGy and neutron fluences up to 1015 n/cm{sup 2} and the degradation of the electrical characteristics was measured versus dose. During irradiation the diodes were submitted to current pulse annealing and after irradiation to thermal annealing. After exposure some diodes show a degradation in forward voltage drop of up to 600 % which, however, can be reduced to about 15 % - 20 % by thermal annealing. The degradation at liquid helium temperature is very similar to the degradation at liquid nitrogen temperature. These degradations of electrical characteristics during the short term irradiation in a nuclear reactor are compared with degradations during long term irradiation in an accelerator environment at liquid nitrogen temperature.
- OSTI ID:
- 416771
- Report Number(s):
- CONF-950722-; TRN: 97:001735
- Resource Relation:
- Conference: CEC/ICMC `95: cryogenic engineering conference and international cryogenic materials conference, Columbus, OH (United States), 17-21 Jul 1995; Other Information: PBD: 1996; Related Information: Is Part Of Advances in cryogenic engineering. Volume 41, Part A & B; Kittel, P. [ed.]; PB: 2037 p.
- Country of Publication:
- United States
- Language:
- English
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