Determination of the dispersion of the index of refraction and the elastic moduli for molecular-beam-epitaxy-grown Zn{sub 1-x}Be{sub x}Se alloys
The prism coupler technique, together with reflectivity channeled spectra, were used to determine the dispersion of the indices of refraction for a series of ternary alloys of Zn{sub 1-x}Be{sub x}Se grown by molecular-beam epitaxy on GaAs substrates. The measurements covered the wavelength range of 400--1300 nm, and the entire Be concentration range, from x=0 to 1.00. The availability of accurate values of the index-of-refraction then enabled us to determine the elastic moduli c{sub 11} for the Zn{sub 1-x}Be{sub x}Se and its dependence on the Be concentration x from frequency shifts in Brillouin scattering spectra observed on the epilayers of these ternary alloys. The c{sub 11} results clearly indicate that the bonding in Zn{sub 1-x}Be{sub x}Se becomes more robust as the Be concentration increases.
- Sponsoring Organization:
- (US)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 40277894
- Journal Information:
- Applied Physics Letters, Vol. 79, Issue 4; Other Information: DOI: 10.1063/1.1379356; Othernumber: APPLAB000079000004000473000001; 032124APL; PBD: 23 Jul 2001; ISSN 0003-6951
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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