skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Seed-layer effect on the microstructure and magnetic properties of Co/Pd multilayers

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.1360685· OSTI ID:40204110

We have investigated Co/Pd multilayers deposited on either Ta or indium tin oxide (ITO) seed layers as a potential perpendicular recording media. We have examined the microstructural evolution of the films deposited on the two different types of seed layers and related it to the magnetic properties of the films. Ta underlayer produces a strong {l_angle}111{r_angle} fiber texture in the multilayer while ITO produces randomly oriented grains. Transmission electron microscopy reveals a microstructure of columnar grains separated by less dense material at the boundaries for the multilayers with an ITO underlayer. However, the less dense material is absent when using a Ta underlayer. The films exhibited strong perpendicular anisotropy and a higher coercivity of {similar_to}6800 Oe and squareness of {similar_to}0.99 are obtained for the films deposited on an ITO seed layer. The differences in the value of coercivity and squareness in the films can be correlated with the differences in the evolution of microstructures for different seed layers. {copyright} 2001 American Institute of Physics.

Sponsoring Organization:
(US)
OSTI ID:
40204110
Journal Information:
Journal of Applied Physics, Vol. 89, Issue 11; Other Information: DOI: 10.1063/1.1360685; Othernumber: JAPIAU000089000011007531000001; 448111MMM; PBD: 1 Jun 2001; ISSN 0021-8979
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English

Similar Records

Magnetic and microstructural properties of CoCrTa/Cr/Al thin films (abstract)
Journal Article · Mon Apr 01 00:00:00 EST 1996 · Journal of Applied Physics · OSTI ID:40204110

Magnetic and structural properties of CoCrTa films and multilayers with Cr
Journal Article · Tue May 01 00:00:00 EDT 1990 · Journal of Applied Physics; (USA) · OSTI ID:40204110

Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue
Journal Article · Fri Sep 15 00:00:00 EDT 1995 · Journal of Applied Physics · OSTI ID:40204110