A multichannel monolithic Ge detector system for fluorescence x-ray absorption spectroscopy
- Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
The construction and performance characteristics of a monolithic quad-pixel Ge detector designed specifically for fluorescence x-ray absorption spectroscopy (XAS) at synchrotron radiation sources is described. The detector semiconductor element has an active surface area of 4.0 cm{sup 2} that is electrically separated into four 1.0 cm{sup 2} pixels, with little interfacial dead volume. The spatial response of the array demonstrates that cross-talk between adjacent pixels is less than 10{percent} for 5.9-keV photons that fall within 0.5 mm of the pixel boundaries. The detector electronics system utilizes preamplifiers built at LBNL with commercial Tennelec Model TC 244 amplifiers. Employing an {sup 55}Fe test source (Mn {ital K}{sub {alpha}}, 5.9 keV), energy resolution of better than 200 eV is achieved with a 4 msec peaking time. At 0.5 msec peaking time, pulse pileup results in a 75{percent} throughput efficiency for an incoming count rate of 100 kHz. Initial XAS fluorescence measurements at the beamline 4 wiggler end stations at SSRL show that the detector system has several advantages over commercially available x-ray spectrometers for low-concentration counting applications. {copyright} {ital 1996 American Institute of Physics.}
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 389561
- Report Number(s):
- CONF-9510119-; ISSN 0034-6748; TRN: 96:027969
- Journal Information:
- Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
- Country of Publication:
- United States
- Language:
- English
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