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Title: Ion irradiated polystyrene: Transport and hardness measurements

Book ·
OSTI ID:375961
; ; ;  [1]
  1. Univ. of Pennsylvania, Philadelphia, PA (United States)

Thin films of polystyrene (PS) were modified using oxygen (O{sup +}) and helium (He{sup +}) ions and analyzed via diffusion and hardness measurements. One micron thick films were modified with 400 keV O{sup +} and He{sup +} ions. The fluence was varied from 1.7 to 34.0 {times} 10{sup 13} ions/cm{sup 2} for both incident ions. Following irradiation, some samples were covered with a probe layer of deuterated PS, and annealed at 170 C. Using forward recoil spectrometry, the diffusion of d-PS and the PS hydrogen loss were measured as a function of incident ion species and dose. For all modified samples, d-PS diffusion was significantly retarded compared to the unmodified case. Atomic force microscopy measurements on the as-cast and irradiated PS samples suggest that the relative hardness of the O{sup +} modified PS was greater than that of the as-cast PS. The force-displacement curves of the modified PS displayed no hysteresis whereas the as-cast PS had a large hysteresis due to tip penetration and tip-polymer adhesion. These results indicate that ion irradiation decreases transport in PS and increases PS hardness.

OSTI ID:
375961
Report Number(s):
CONF-941144-; ISBN 1-55899-255-3; TRN: IM9642%%49
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994; Other Information: PBD: 1995; Related Information: Is Part Of Beam-solid interactions for materials synthesis and characterization; Jacobson, D.C. [ed.] [AT and T Bell Labs., Murray Hill, NJ (United States)]; Luzzi, D.E. [ed.] [Univ. of Pennsylvania, Philadelphia, PA (United States)]; Heinz, T.F. [ed.] [Columbia Univ., New York, NY (United States)]; Iwaki, Masaya [ed.] [Inst. of Physical and Chemical Research, Wako, Saitama (Japan)]; PB: 763 p.; Materials Research Society symposium proceedings, Volume 354
Country of Publication:
United States
Language:
English