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Title: Monolithically integrated X-ray detector arrays for computed tomography

Book ·
OSTI ID:323898
; ;  [1];  [2]; ;  [3];  [4];  [5]
  1. Spire Corp., Bedford, MA (United States)
  2. Univ. of South Florida, Tampa, FL (United States). Dept. of Electrical Engineering
  3. Univ. of Delaware, Newark, DE (United States). Inst. for Energy Conversion
  4. Analogic Corp., Peabody, MA (United States)
  5. Picker International, Highland HTS, OH (United States)

The design and performance of a high sensitivity monolithic X-ray detector array fabricated by depositing CdTe photodiodes on CdWO{sub 4} scintillators for computed tomography (CT) are presented. CdTe photodiodes offer improved sensitivity due to the better match to the CdWO{sub 4} scintillator emission spectrum than the Si photodiodes used in current CT scanners. A CdTe photodiode fabricated on glass mechanically stacked to a CdWO{sub 4} scintillator showed 30% improvement in signal strength over Si photodiodes stacked to CdWO{sub 4}. Monolithic X-ray detector arrays were fabricated by depositing a CdTe photodiode structure on CdWO{sub 4} using close-spaced sublimation technique. Preliminary results on the detector`s X-ray response, signal-to-noise ratio and the X-ray temporal response show that monolithic CdTe X-ray detectors are suitable for practical CT scanner applications.

Sponsoring Organization:
National Cancer Inst., Bethesda, MD (United States)
OSTI ID:
323898
Report Number(s):
CONF-971201-; TRN: 99:004424
Resource Relation:
Conference: 1997 fall meeting of the Materials Research Society, Boston, MA (United States), 1-5 Dec 1997; Other Information: PBD: 1998; Related Information: Is Part Of Semiconductors for room-temperature radiation detector applications 2; James, R.B. [ed.] [Sandia National Labs., Livermore, CA (United States)]; Schlesinger, T.E. [ed.] [Carnegie Mellon Univ., Pittsburgh, PA (United States)]; Siffert, P. [ed.] [Lab. PHASE/CNRS, Strasbourg (France)]; Dusi, W. [ed.] [Inst. TESRE/CNR, Bologna (Italy)]; Squillante, M.R. [ed.] [Radiation Monitoring Devices, Inc., Watertown, MA (United States)]; O`Connell, M. [ed.] [Dept. of Energy, Washington, DC (United States)]; Cuzin, M. [ed.] [LETI/CEA, Grenoble (France)]; PB: 681 p.; Materials Research Society symposium proceedings, Volume 487
Country of Publication:
United States
Language:
English

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